Numerical analysis of single-point spectroscopy curves used in photo-carrier dynamics measurements by Kelvin probe force microscopy under frequency-modulated excitation

• Pablo A. Fernández Garrillo,
• Benjamin Grévin and
• Łukasz Borowik

Beilstein J. Nanotechnol. 2018, 9, 1834–1843, doi:10.3762/bjnano.9.175

• nanostructure and photo-transport mechanisms has become of crucial importance for the development of many emerging photovoltaic technologies. In this context, Kelvin probe force microscopy under frequency-modulated excitation has emerged as a useful technique for probing photo-carrier dynamics and gaining

• experimental results as additional information about the photo-carrier dynamics of the sample can be gained via the numerical analysis. Keywords: carrier dynamics; carrier lifetime; carrier recombination; Kelvin probe force microscopy; nanostructured photovoltaics; numerical simulations; photo-carrier

• dynamics; Introduction In the past decade, the nanoscale investigation of materials properties has captured the attention of the scientific community, partially due to its crucial importance in the improvement of photovoltaic devices [1][2]. Carrier lifetime, or more broadly speaking, photo-carrier